Hprobe announces the introduction of its new magnetic test instrument dedicated to wafer-level testing of the latest generation of TMR sensors under 3D magnetic field conditions.
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Hprobe annonce la clôture réussie du projet ATEMI, une avanc…
Le projet ATEMI, mené par Hprobe et ses partenaires, a abouti à : Le déploiement d'un premier équipement de test chez un des principaux fondeurs de...
Hprobe Announces Breakthroughs in MRAM Wafer Testing to Supp…
Grenoble, France, December 1, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Leading Magnetic ATE Company Hprobe Expands Presence into Ko…
Grenoble, France, February 3, 2022 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces New Generation of Magnetic Test Head for W…
Grenoble, France, November 30, 2021 – Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today...
Hprobe Announces Breakthrough in High-Volume Testing for Aut…
Grenoble, France, June 15, 2021 – Hprobe, a provider of semiconductor Automated Test Equipment (ATE) for magnetic devices, today announced the...

